Open Access Open Access  Restricted Access Subscription or Fee Access

Implementation of UART with CALBO

Nishtha Singh, Sangeeta Mangesh

Abstract


The increasing growth of submicron technology has resulted in the difficulty of VLSI testing for designers who always look for simple and cost effective logic structure to realize a complex function. Thus Automatic Testing Equipment (ATE) is becoming costly process for testing. To reduce the cost of testing the chips, Built in Self-Test (BIST) has emerged as a cheaper alternative. BIST is a design technique that allows the chip to test itself. Several architectures are used for implementing BIST. In this paper, the BIST is implemented using CALBO architecture on UART using Verilog. The simulation and synthesis of the design are performed using ModelSim SE PLUS 6.5 simulator and XILINX ISE 14.5 synthesis tool.

 

Keywords: ATE, BIST, CALBO, Power Analysis, UART

Cite this Article

Nishtha Singh, SangeetaMangesh, Implementation of UART with CALBO. Journal of Microelectronics and Solid State Devices. 2015; 2(1): 6–12p.


 


References


Alauddin Mohd. Ali, Bambang Sunaryo Suparjo, Ishak Aris, Liakot Ali, Roslina Sidek, 2004. Design of a micro - UART for SoC application. Computers and Electrical Engineering 30, Elsevier.

Nennie Farina Mahat, 2012. Design of 9 – Bit UART Module Based on Verilog HDL. Proceeding of Semiconductor Electronics (ICSE)

Arun Khosla, Balwinder Singh, Shikha Kakar, 2009. Implementation of BIST Capability using LFSR Techniques in UART. International Journal of Recent Trends in Engineering , 3, May 2009, Vol 1,

M. Serra, T. Slater, J. C. Muzio and D. M. Miller, “The analysis of one-dimensional linear cellular automata and their aliasing properties,” IEEE Transaction on Computer-Aided Design, vol. 9, pp. 767-778, July 1990.

Thyagaraju Damarla, Avinash Sathaye, 1993. Applications of One- dimensional Cellular Automata and Linear Feedback Shift Registers for Pseudo- exhaustive Testing, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, VOL. 12, NO. 10, OCTOBER 1993

Stanley L. Hurst, VLSI Testing Digital and Mixed Analogue/Digital Techniques (The Institution of Electrical Engineers, London, 1998)


Full Text: PDF

Refbacks

  • There are currently no refbacks.