Morphological, Optical and Structural Studies of Deposited ZnO Films by SILAR Method for Solar Energy Applications
Abstract
The deposited ZnO films were grown on glass substrates using the Successive Ionic Layer Adsorption and Reaction. The morphology of the deposited ZnO is that of flower-like bud.The optical properties were characterized using UV/VIS spectroscopy, the optical band gap decreases with increasing reaction time, and these films have band gap values of 3.19eV, 3.22eV, 3.24eV and 3.25eV. The crystal structure of the films were also characterized using the X-Ray Diffraction spectroscopy, Prominent among them are the peaks at 2θ values of around 32.50, 35.90 and 38.50 corresponding to the diffraction lines produced by (100), (002) and (103) planes respectively.Keywords: ZnO films, SILAR, optical band gapVeröffentlicht
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