Patterning of Carbon Nanotubes on Silicon Wafer Using Self-Assembly Techniques

Abstract

Nanotechnology is an emerging technology that enables scientists to develop new materials and products at the molecular level. A carbon nanotube (CNT) is a rolled sheet of carbon atoms, coaxially arranged in cylindrical shape. Single-walled CNTs are ideal quantum systems for exploring basic science in one dimension. To find use in electronics, single-walled CNTs need to be efficiently separated by electronic type and aligned to ensure optimal and reproducible electronic properties. Using self-assembly techniques, an attempt was made at selectively patterning and sorting semiconducting versus metallic SWCNTs on (3-aminopropyl)triethoxysilane (APTES) and phenyl triethoxysilane (PTEOS) coated films on Si (100). The patterned substrates were characterized using atomic force microscopy (AFM), optical microscopy, scanning electron microscopy (SEM) and Raman spectroscopy.

Keywords: carbon nanotubes, self-assembly monolayers, nanomaterial characterization technique, Atomic Force Microscopy, SWCNT

Cite this Article

Balachander R, Sakthivel G. Patterning of Carbon Nanotubes on Silicon Wafer Using Self-Assembly Techniques. Journal of Nanoscience, Nanoengineering and Applications. 2015; 5(2): 6-15p.