Journal of VLSI Design Tools & Technology

Lavania, Shilpi, Hindustan College of Science & Technology Farah,Mathura, India

• Vol 1, No 2 - 3 (2011) - Review Articles
  An Explicit Approach to Compare Crosstalk Noise and Delay in VLSI RLC Interconnect Modeled with Skin Effect with Step and Ramp Input
  Abstract